20150307

Upcoming Event: The ConFab

ON-DEMAND WEBCAST:
The next move in metrology and defectivity for the semiconductor industry - The semiconductor industry today is showing two major trends, as we are approaching the end of the Moore’s Law era. First, the complexity of the process flow used to make a device has increased extremely fast in recent years. Second, market demands extend beyond the device to the system, which integrates different functions to achieve a task, leading to 3D integration approaches. The presentation will cover our vision of the consequences of those trends in metrology and defectivity requirements. Carlos Beitia is the Metrology and Defectivity Manager, CEA-Leti, will present: the use of more and more in-lab characterization to complement in-line metrology; the need to combine measurements whether to improve uncertainty in a given parameter or improve knowledge of the object under study; the need for in-die characterization that provides information to complete the picture at transistor and wafer level; 3D integration problems, and more.
Speakers:
Winfield Scott, Director of Technology, Evans Analytical Group
Carlos Beitia, Metrology and Defectivity Manager, CEA-Leti
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WHITE PAPER: 
The use of imaging colorimeter systems and analytical software to assess display brightness and color uniformity, contrast, and to identify defects in FPDs is well established. A fundamental difference between imaging colorimetry and traditional machine vision is imaging colorimetry’s accuracy in matching human visual perception for light and color uniformity. This white paper describes how imaging colorimetry can be used in a fully-automated testing system to identify and quantify defects in high-speed, high-volume production environments.
Download the White Paper
First Keynote: Ali Sebt, President and CEO, Renesas America
Second Keynote: Paolo Gargini, Chairman, ITRS

Hear insight on business and economic trends, technology forecasts and strategic assessments of the challenges and opportunities facing the industry at the 11th Annual ConFab Conference and Networking event. Space is limited – purchase your Total Access Pass today.

The ConFab
May 19-22, 2015
Encore at the Wynn, Las Vegas
Presented by:
Solid State Technology
View the 2015 Agenda
Interested in presenting in a future Solid State Technology webcast? We are currently looking for speakers for several upcoming webcasts. Click HERE to contact an editor for a list of upcoming topics and more details.
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